EKM
Structured sample Lecture RABiTS tape
Atoms Structured sample In the Lab

diese Seite in Deutsch


Main page
Contact us
How to find us
Image gallery
Group members
Research
Oxide thin films
Oxide crystals
Scanning Probes
Sample characterization
Ionic crystals
Superconductivity
Theory
Publications
Lectures and Seminars, Winter Term 2011/2012
Additional information
TRR 80
Emergency Phone Numbers
Sitemap
Legal/Imprint

Klausurergebnisse

Physik III

LaTeX

diese Seite in Deutsch

02/01/2012



counter
 

Chair Experimental Physics VI

Ionic crystals

Scanning force microscopy examples: Ionic crystals

Ionic crystals can easily be cleaved and are - like e.g. also graphite - frequently used to check the noise level of the instrument and the z calibration of the scanner. On the small scale, steps and screw dislocations are visible.
KBr (lattice constant 330pm)
Derivative of the topographic signal, image size 13 µm. Instrument: Digital Instruments Nanoscope IIIa Multimode, in Tapping Mode.
Click here to see the full size 
image
On a larger scale, the circular hills are arranged in a well-ordered structure.ee
Image size 50 µm; topographic image (z scale 40 nm)
Click here to see the 
full size image

Image size 50 µm; topographic image (z scale 40 nm) and derivative of topography.
Instrument: Park Scientific Instruments Autoprobe CP, in Intermittent Contact Mode.
Click here to see 
the full size image
Images with atomic resolution are possible in ultrahigh-vacuum, obtained with a home-built instrument based on a qPlus force sensor (Markus Herz 2002, unpublished). Topographic image of KCl (lattice constant 315pm), image size 1.9nm, height variation approx. 50pm.