Materialwiss. Master Wintersemester 2003/2004
06464 Methodenkurs Ib, Electron Microscopy [WPV]
Dozent Haider, Horn, Lindner
Dauer 6 SWS
Studiensemester 1
Schein Ja (Abschlußbericht; 8 LP)
Termin Mo, 8:30-15:30, 344/Nord
Beginn 27.10.03
Inhalt This course combines morning lectures on fundamental scanning and transmission electron microscopy (SEM and TEM) with subsequent all day practical training classes using the electron microscopy equipment available at the institute. The course will enable successful students to perform simple SEM and TEM investigations including the necessary sample preparation at the end of the course. Topics of the course include:
  • Layout of Electron Microscopes and Electron Optical Components
  • Contrast Formation in Scanning Electron Microscopy (SEM)
  • Chemical Analysis by SEM
  • Special Applications of SEM
  • TEM specimen preparation techniques
  • Components of a TEM, principle lens design, lens aberrations
  • Electron diffraction: fundamentals
  • Contrast formation at bright field, dark field, weak beam dark field, and many beam conditions, "chemical" imaging
  • Kinematical theory of electron wave propagation in crystals
  • Dynamic theory of wave propagation in crystals, Howie Whelan equations, contrast of defects
  • High resolution TEM, lattice imaging of crystals
  • Advanced diffraction techniques:Kikuchi patterns,
  • Advanced diffraction techniques: HOLZ lines and Convergent Beam Diffraction (CBED)
  • Analytical TEM: Electron energy loss spectroscopy & energy filtered TEM (EFTEM)
A detailed schedule will be presented during the first class.

Students have to document their experimental work in a lab book.

Vorkenntnisse Fundamental knowledge is required in:
  1. Quantum mechanics
  2. Solid state physics
  3. Diffraction physics
  4. Crystallography
Literatur D.B.Williams and C.B.Carter, Transmission Electron Microscopy, Plenum Press, New York/London, 1996

An extended list of references will be given at the course.