Suche

06460


Materialwiss. Master Wintersemester 2003/2004
06460 Einführung in materialwissenschaftliche Analysemethoden [PV]
   
Dozent Dozenten der exp. Lehrstühle der Physik
Dauer 4 SWS
Studiensemester 1
Schein Ja (Klausur; 6 LP)
Termin Mo, 16:00-17:15 u. Do, 16:00-17:30, 2004/HZ
Beginn 27.10.03
Inhalt This round lecture gives an overview about the facilities and experimental methods available in the institute and/or important for materials science students

Program

Mo., 27.10., Do. 30.10. Lindner: Electron microscopy

Mo., 3.11., Do. 6.11. Scherer: Diffraction methods

Mo., 10.11., Do. 13.11. Stritzker: Ion beam analysis - RBS/Channeling, SIMS

Mo., 17.11., Do. 20.11. Horn: Corrosion - processes and prevention

Mo., 24.11., Do. 27.11. Haider: Mechanical characterisation and mechanical spectroscopy

Mo., 1.12., Do. 4.12. Claessen: Surface analysis with electrons: ESCA, LEED and STM

Mo., 8.12., Do. 11.12. Tidecks: low temperature measurements

Mo., 15.12., Do. 18.12. Giessibl: scanning probe microscopy (Prinzip von Rastertunnel- und Rasterkraftmikroskopie)

Do. 8. 1, Mo. 12. 1., Do. 15. 1. Reller/Hanss: Thermal analysis

Mo. 19. 1., Do. 22. 1. Loidl: Dielectric spectroscopy

Mo. 26. 1., Do. 29. 1. Mannhart: Low Noise Electronic Measurements

Mo. 2. 2., Do. 5. 2. Wixforth: Contactless transport measurements in thin film semiconductors at low temperatures and high magnetic fields

Mo. 9. 2., Do. 12. 2. Brütting: Organic Semiconductors - Thin Film Preparation and Characterisation