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Spintronics

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Seminar über Elektronische Korrelationen und Magnetismus

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09/01/2014



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Chair Experimental Physics VI

STM/AFM images



AFM-Image with 77 pm resolution
AFM-Image with 77 pm resolution. Subatomic structures are visible within single tungsten atoms. Image size 500 × 500 pm2.


Render-Images
Render-Images calculated from AFM-Data


Revealing the hidden graphite-atom
Revealing the hidden atom in graphite with AFM showing all atoms within the hexagonal graphite unit cells. Image size 2×2 nm2.


AFM image of a phonecard chip
Conducting paths in a chip out of a phonecard. You can see intersecting conducting paths on different planes, which have a distance of vaguely one micrometer.

Imaged with a Nanosurf easyscan DFM. Advanced Lab Course 20, Augsburg University, EKM, Experimentalphysik 6.


Experimental images of a Si surface
Experimental images of a Si surface imaged in the dynamic STM mode. The different radii of the atomic images in a)-c) are explained by different higher angular momentum tunneling states. Images taken with tips made from different elements: a) silicon tip b) cobalt tip c) samarium tip [Phys. Rev. B 68, (2003)].


AFM image showing steps on a Si (111) surface
Steps on (111) orientated silicon wafer imaged with a Nanosurf easyScan DFM. Advanced Lab Course 20, Augsburg University, EKM, Experimentalphysik 6.


AFM image of a peacock butterfly
Wing of a Peacock Butterfly imaged with a Nanosurf easyScan DFM. Sample preparation Dr. Eckhard Hartmann (Augsburg University, Biology). Advanced Lab Course 20, Augsburg University, EKM, Experimentalphysik 6.


STM image of silicon, obtained with a lateral force sensor
Image of a Si surface imaged with a lateral force sensor. In the left half of the image, the cantilever does not oscillate, in the right half it oscillates with an amplitude of 0.09 nm, yielding a double image of every atom.


AFM image of silicon, obtained with a qPlus force sensor with a single crystal silicon tip
AFM image of silicon, obtained with a qPlus force sensor with a single crystal silicon tip. Image size 3.3 nm x 3.3 nm. [Ann. Phys. (Leipzig) 10, 887 (2001)].


Subatomic resolution by atomic force microscopy Gerhard Richter Erster Blick
First experimental image showing internal atomic structures [Science 289, 422 (2000)]. This image has inspired Gerhard Richter, one of the most influental contemporary painters, to craft the lithographic print "Erster Blick" (2000). See: Dietmar Elger, "Gerhard Richter: Biografie und Werk", Dumont, Cologne 2002, pp 119-120.


Subatomic resolution by AFM
First experimental image showing internal atomic structures.


First atomic resolution AFM image of a reactive surface Silicon Si (111) - (7x7)
First atomic resolution AFM image of a reactive surface. Image size 18 nm x 18 nm. Science 267, 68 (1995).