Materialwiss. Master Wintersemester 2005/2006
06348 Scanning-Tunneling and Scanning-Force Microscopy [WPV]
Dozent Gießibl F.
Dauer 3 SWS
Studiensemester 1
Schein Ja (Klausur; 5 LP)
Termin Mo, 14:15-15:45, 288/Süd
Beginn 17.10.05
Inhalt Scanning tunneling - and scanning force microscopy allow to see, feel and move single atoms on flat surfaces and can be viewed as eyes and hands for the nanoworld. The lecture captures the following issues:

  • Historic overview about the development of STM and AFM
  • Physics of electron-tunneling
  • Physics of interatomic forces as well as mesoscopic objects
  • Basic setup of scanning probe microscopes
  • Basic electronics and low-noise techniques
  • Lab visits
Begleitend 06349
Vorkenntnisse Classical mechanics, electrodynamics and quantum theory.
  • Chen C.J., Introduction to Scanning Tunneling Microscopy. Oxford University Press, New York (1993).
  • Morita S. et al. (Eds.), Noncontact Atomic Force Microscopy. Springer (2002).
  • Vorlesungsskript (in German).
  • Springer Handbook of Nanotechnology, B. Bushan (Ed.) Springer (2004).