Suche

06458


Materialwiss. Master Sommersemester 2011
06458 Method Course: X-ray and Neutron Diffraction Techniques (mit Exkursion) [WPV]
   
Dozent Scherer W., Eickerling G.
Dauer 6 SWS
Studiensemester 0
Schein Ja (8 LP)
Termin Mo, 10:00-11:30, 439/S (Voranmeldung bis 28.02.2011)
Inhalt Inhalt des Praktikums und der begleitenden Vorlesungen sind die theoretischen Grundlagen und praktische Anwendung von Röntgen- und Neutronenbeugungsmethoden:
  1. Basic introduction to X-ray and neutron crystallography [4+2]
  2. X-ray/Neutron Scattering [4+2]
  3. Data Collection and Reduction techniques [4+2]
  4. Symmetry and Space Group Determination [4+2]
  5. Structural Refinements: (a) The Rietveld Method (b) Difference Fourier Syn-thesis [4+2]
  6. Structure Determination: (a) Patterson Method (b) Direct Methods [4+2]
  7. Interpretation of Structural Refinement Results [4+2]
  8. Electronic Structure Determination and Analysis [2+1]
Literatur
  1. C. Hammond, The Basis of Crystallography and Diffraction, Oxford University Press Inc., New York, 2001.
  2. W. Clegg, A. J. Blake, R. O. Gould, P. Main, Crystal Structure Analysis, Prin-ciple and Practice, Oxford University Press Inc., New York, 2001.
  3. G. Giacovazzo, Fundamentals of Crystallography, Oxford University Press Inc., New York, 1994.
  4. R. A. Young, The Rietveld Method, Oxford University Press Inc., New York, 2002.
  5. W. Massa, Crystal Structure Determination, Springer, Berlin, 2004.