Materialwiss. Elite Sommersemester 2013
06480 High Resolution Imaging [PV]
Dozent Horn S.
Dauer 2 SWS
Studiensemester 0
Schein Nein
Termin Do, 10:00-11:30, 344/R
Inhalt After an introduction the lecture will first focus on electron microcopy
  • Principles of electron microscopy
  • Electron-solid interaction
  • Contrast formation in scanning electron microscopy
  • Chemical analysis by scanning electron- and Auger microscopy
The topic of the second part of the lecture is scanning probe microscopy

  1. Physical basis of STM and AFM
    - Tip – surface interaction
    - Tunnelling effect
  2. Technical basis of STM and AFM
    - Design principles
    - Mechanical setup
    - Electronics
    - Imaging processes
    - Modes of operation
  3. Other scanning probe techniques
Finally applications of the discussed methodes are presented.
Begleitend 06481
Vorkenntnisse Solid state physics
  • Neil W. Ashcroft; N. David Mermin "Solid State Physics"
  • A. Zangwill "Physics at surfaces"
  • W. Unertl "Handbook of surface science 1 + 2"
  • C.J. Chen "Introduction to scanning tunneling microscopy"
  • Morita "Noncontact atomic force microscopy"
  • L. Reimer "Scanning electron microscopy"
Weitere Informationen Please register for tutorials via digicampus. Further information and announcements regarding lecture, tutorial or exam will also be posted there.