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06480


Materialwiss. Elite Sommersemester 2010
06480 High Resolution Imaging [PV]
   
Dozent Horn S.
Dauer 2 SWS
Studiensemester 0
Schein Ja (unbenotet)
Termin 14.06. - 23.07.2010, Mo 10:00-11:30, 439/Süd
Mi, 10:00-11:30, 403/Süd
Inhalt After an introduction the lecture will first focus on electron microcopy

  • Principles of electron microscopy
  • Electron-solid interaction
  • Contrast formation in scanning electron microscopy
  • Chemical analysis by scanning electron- and Auger microscopy
The topic of the second part of the lecture is scanning probe microscopy

  1. Physical basis of STM and AFM
    -Tip – surface interaction
    -Tunnelling effect
  2. Technical basis of STM and AFM
    -Design principles
    -Mechanical setup
    -Electronics
    -Imaging processes
    -Modes of operation
  3. Other scanning probe techniques
Finally applications of the discussed methodes are presented.
Begleitend 06481
Vorkenntnisse Solid State Physics
Literatur Neil W. Ashcroft ; N. David Mermin "Solid State Physics" A. Zangwill "Physics at surfaces"
W. Unertl "Handbook of surface science 1 + 2"
C.J. Chen "Introduction to scanning tunneling microscopy "
Morita "Noncontact atomic force microscopy "
L. Reimer "Scanning electron microscopy"