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Thickness Dependence of the Irreversibility Line in YBa2Cu3O7 Epitaxial Thin Films

A. Neminsky, J. Dumas, B. P. Thrane, C. Schlenker, H. Karl und B. Stritzker

erschienen 1994 Physical Review B (Condensed Matter) vol.50, no.5, 3307–3311 (1994)