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A general approach to obtain soft x-ray transparency for thin films grown on bulk substrates

M. Fohler, S. Frömmel, M. Schneider, B. Pfau, C. M. Günther, M. Hennecke, E. Guehrs, L. Shemilt, D. Mishra, D. Berger, S. Selve, D. Mitin, M. Albrecht, and S. Eisebitt

Review of Scientific Instruments 88, 103701 (2017). [DOI Link]