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Characterization of organic thin films on ferromagnetic substrates by spectroscopic ellipsometry and magneto-optical Kerr effect spectroscopy

M. Fronk, C. Schubert, F. Haidu, C. Scarlat, K. Dörr, M. Albrecht, D. R. T. Zahn, and G. Salvan

erschienen 19.10.2012 IEEE Trans. Magn. 48, (2012) 2777. [DOI Link]